- Diam.Rel.Mater. (2016)
- DOI: 10.1016/j.diamond.2016.08.011
The paper deals on the response of a polycrystalline diamond sensor, 500 μm thick, to particles from a 90Sr β-source. 21 × 21 nano-carbon pads, with 0.18 mm × 0.18 mm area each, were realized by ArF excimer laser irradiation on one diamond face, whereas a 7 × 7 mm2 backside contact was fabricated and used for sensor biasing during characterization of sensor under β-source irradiation. The carbon pads embrace a number of grains, which show different degrees of surface graphitization dependent on the grain orientations. Each carbon pad exhibits a linear I(V) response up to 200 V. The average number of charge carriers collected by a single pixel, as well as the distribution of pixels involved by the impinging particle tracking, is analyzed as a function of the applied voltage recording the signals acquired by 16 pixels at a time. The pulse height distribution is not affected by reversing the bias polarity. For a single pixel, the most probable collected charge value is 1.40 ± 0.02 fC whereas the main value gives 〈Q〉coll = 1.67 ± 0.02 fC (10,430 ± 120 electrons). The charge collection distance was measured taking into account the effect induced by high-energy electrons and found to be 285 ± 3 μm, demonstrating the absence of bulk defects induced by the laser graphitization processing. Cross-talk effects between nearest-neighbor pixels have been excluded analyzing the results obtained in a batch of more than 1000 events even if the same cannot be excluded under higher energy particles.